| 摘要 |
The present invention relates to an analytical method of graphene and, more specifically, relates to a method to examine a thickness (a number of layers) of graphene samples, the thickness of nanothin films, and a size of nanocrystal grains (average value, distribution, or the like) based on a technology used in a method to accurately measure and determine the thickness of a super thin graphene in units of atoms, molecules, and nanoparticles, which has remained as a difficult problem up until now and has allowed only by theoretical approach, and the data acquired thereof. The present invention provides an analytical method of graphene, which comprises: (a) a step of performing an XRD measurement of graphene defined by a number of layers (002) to acquire a diffraction peak; and (b) a step of deducing effective information on the thickness of graphene including a full width at half maximum (FWHM) and a distance between layers (d_002) from the peaks (002) by number of layers of graphene. |
