| 发明名称 |
CMOS radiation-measuring circuit with a variable threshold |
| 摘要 |
A radiation measuring technique includes adjusting a threshold level of a radiation sensor in a radiation-measuring circuit and obtaining an output signal based on radiation dose sensed by the radiation sensor.
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| 申请公布号 |
US7288752(B2) |
申请公布日期 |
2007.10.30 |
| 申请号 |
US20030620829 |
申请日期 |
2003.07.16 |
| 申请人 |
INTEL CORPORATION |
发明人 |
KESHAVARZI ALI;SEGURA JAUME A.;DE VIVEK K. |
| 分类号 |
G01J1/44;G01T1/02;G01T1/24;H01L31/00;H03K17/78 |
主分类号 |
G01J1/44 |
| 代理机构 |
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