发明名称 HARDMASK COMPOSITION AND METHOD OF FORMING PATTERN BY USING THE HARDMASK COMPOSITION
摘要 A hardmask composition may include a solvent and a 2-dimensional carbon nanostructure containing about 0.01 atom % to about 40 atom % of oxygen or a 2-dimensional carbon nanostructure precursor thereof. A content of oxygen in the 2-dimensional carbon nanostructure precursor may be lower than about 0.01 atom % or greater than about 40 atom %. The hardmask composition may be used to form a fine pattern.
申请公布号 US2015348794(A1) 申请公布日期 2015.12.03
申请号 US201514725390 申请日期 2015.05.29
申请人 Samsung Electronics Co., Ltd. 发明人 KIM Sangwon;SHIN Hyeonjin;PARK Seongjun
分类号 H01L21/308;H01L21/02;H01L21/324 主分类号 H01L21/308
代理机构 代理人
主权项 1. A hardmask composition comprising: a 2-dimensional carbon nanostructure containing about 0.01 atom % to about 40 atom % of oxygen or a 2-dimensional carbon nanostructure precursor thereof; and a solvent.
地址 Suwon-si KR