| 摘要 |
PROBLEM TO BE SOLVED: To provide a manufacturing method of a probe card pin used for inspection of an LSI chip or the like.SOLUTION: The manufacturing method includes: a bent plate formation process of using a metallic material for a probe card pin to form a bent plate 11 including a bent part 12 that has a certain width W2 and is bent along the width direction; and a multiple cutting process of obtaining a plurality of pin members 14 by cutting the bent plate 11 in the direction perpendicular to the longitudinal direction or the direction tilted from the perpendicular direction at a constant interval in the longitudinal direction. The bent part 12 of the bent plate 11 is bent along the width direction of the bent plate 11, and has a uniform shape along the longitudinal direction. |
