发明名称 DRY CLEANING METHOD AND PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To reduce metal contamination in a processing chamber.SOLUTION: There is provided a dry cleaning method for a plasma processing apparatus including: a processing container having a member containing chromium (Cr); a mounting table which is disposed in the processing container and on which a substrate is mounted; and a gas supply source for supplying a gas into the processing container. The dry cleaning method includes a first step of supplying a first cleaning gas containing oxygen into the processing container and supplying high-frequency power or microwave power to generate plasma of the first cleaning gas, and a second step of supplying a second cleaning gas containing bromine into the processing container after the first step.
申请公布号 JP2015211156(A) 申请公布日期 2015.11.24
申请号 JP20140092679 申请日期 2014.04.28
申请人 TOKYO ELECTRON LTD 发明人 ISHIKAWA YOSHIO;GAO JUN;KAINO HIDEMASA
分类号 H01L21/3065 主分类号 H01L21/3065
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