发明名称 |
SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING METHOD, PROGRAM, AND COMPUTER STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a substrate processing system which inhibits a coating liquid from being applied to an outer peripheral part of a substrate and properly performs substrate processing.SOLUTION: A substrate processing system supplies a hydrophobic agent H to an outer periphery part of a support wafer S from a hydrophobic agent nozzle while rotating the support wafer S held by a spin chuck. Then, the substrate processing system supplies an adhesive G to the support wafer S from an adhesive nozzle while relatively moving the support wafer S held by the holding part and the adhesive nozzle in a horizontal direction. At that time, the hydrophobic agent H prevents the adhesive G from being applied to the outer periphery part of the support wafer S. Further, a film thickness Tof the adhesive G on the support wafer S is larger than a film thickness Tof the hydrophobic agent H on the outer periphery part of the support wafer S. |
申请公布号 |
JP2015207691(A) |
申请公布日期 |
2015.11.19 |
申请号 |
JP20140088064 |
申请日期 |
2014.04.22 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
OKAWA OSAMU |
分类号 |
H01L21/02;B05C9/06;B05C11/08 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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