发明名称 SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING METHOD, PROGRAM, AND COMPUTER STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing system which inhibits a coating liquid from being applied to an outer peripheral part of a substrate and properly performs substrate processing.SOLUTION: A substrate processing system supplies a hydrophobic agent H to an outer periphery part of a support wafer S from a hydrophobic agent nozzle while rotating the support wafer S held by a spin chuck. Then, the substrate processing system supplies an adhesive G to the support wafer S from an adhesive nozzle while relatively moving the support wafer S held by the holding part and the adhesive nozzle in a horizontal direction. At that time, the hydrophobic agent H prevents the adhesive G from being applied to the outer periphery part of the support wafer S. Further, a film thickness Tof the adhesive G on the support wafer S is larger than a film thickness Tof the hydrophobic agent H on the outer periphery part of the support wafer S.
申请公布号 JP2015207691(A) 申请公布日期 2015.11.19
申请号 JP20140088064 申请日期 2014.04.22
申请人 TOKYO ELECTRON LTD 发明人 OKAWA OSAMU
分类号 H01L21/02;B05C9/06;B05C11/08 主分类号 H01L21/02
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