发明名称 Method of manufacturing a sensor for sensing analytes
摘要 A method of manufacturing a sensor for sensing analytes, the method including: with a dicing saw, removing material from a substrate, thereby forming an array of columnar protrusions at a first surface of the substrate; forming an insulating layer coupled to exposed surfaces of the substrate and exposed surfaces of the array of columnar protrusions; removing a portion of the insulating layer at a second surface of the substrate, directly opposed to the first surface of the substrate; with the dicing saw, removing material from a distal end of each columnar protrusion in the array of columnar protrusions, thereby defining a sharp tip, uncovered by the insulating layer, at the distal end of each columnar protrusion in the array of columnar protrusions; and coupling a conductive layer to the sharp tip of each columnar protrusion in the array of columnar protrusions.
申请公布号 US9182368(B2) 申请公布日期 2015.11.10
申请号 US201414211404 申请日期 2014.03.14
申请人 Sano Intelligence, Inc. 发明人 Pushpala Ashwin;Szmodis Alan;Chapman Matthew;Hall Weldon;Miller Scott;Hafezi Hooman
分类号 A61B5/145;A61B5/1486;G01N27/327;A61B5/00;A61M25/00 主分类号 A61B5/145
代理机构 代理人 Schox Jeffrey;Wong Ivan
主权项 1. A method of manufacturing a sensor for sensing analytes, the method comprising: with a dicing saw, removing material from a substrate, thereby forming an array of columnar protrusions at a first surface of the substrate; forming an insulating layer coupled to exposed surfaces of the substrate and exposed surfaces of the array of columnar protrusions; removing a portion of the insulating layer at a second surface of the substrate, directly opposed to the first surface of the substrate; with the dicing saw, removing material from a distal end of each columnar protrusion in the array of columnar protrusions, thereby defining a sharp tip, uncovered by the insulating layer, at the distal end of each columnar protrusion in the array of columnar protrusions; and coupling a conductive layer to the sharp tip of each columnar protrusion in the array of columnar protrusions.
地址 San Francisco CA US
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