发明名称 Polishing pad, manufacturing method therefor, and method for manufacturing a semiconductor device
摘要 A polishing pad having a polishing layer comprising a thermoset polyurethane foam, wherein the thermoset polyurethane foam contains, as raw material components, an isocyanate component, and active-hydrogen-containing compounds, and the active-hydrogen-containing compounds comprise one or more polyol compounds (each) having two or more functional groups, and a monool compound having one functional group.
申请公布号 US9181386(B2) 申请公布日期 2015.11.10
申请号 US201113634218 申请日期 2011.03.17
申请人 Toyo Tire & Rubber Co., Ltd. 发明人 Doura Masato;Ishizaka Nobuyoshi
分类号 C08G18/28;C08G18/79;C08G18/42;C08G18/48;C08G101/00 主分类号 C08G18/28
代理机构 Morrison & Foerster LLP 代理人 Morrison & Foerster LLP
主权项 1. A polishing pad having a polishing layer comprising a thermoset polyurethane foam, wherein the thermoset polyurethane foam contains, as raw material components, an isocyanate component, and active-hydrogen-containing compounds, and the active-hydrogen-containing compounds comprise one or more polyol compounds, each of which has two or more functional groups, and a monool compound having one functional group, and the monool compound is a compound represented by the following general formula (1): R1-(OCH2CHR2)n-OH  (1) wherein R1 is a methyl or ethyl group, R2 is a hydrogen atom, or a methyl group, and n is an integer of 1 or 2, and the thermoset polyurethane foam has substantially spherical bubbles having an average bubble diameter of 20 to 300 μm.
地址 Osaka-shi JP