发明名称 |
Polishing pad, manufacturing method therefor, and method for manufacturing a semiconductor device |
摘要 |
A polishing pad having a polishing layer comprising a thermoset polyurethane foam, wherein the thermoset polyurethane foam contains, as raw material components, an isocyanate component, and active-hydrogen-containing compounds, and the active-hydrogen-containing compounds comprise one or more polyol compounds (each) having two or more functional groups, and a monool compound having one functional group. |
申请公布号 |
US9181386(B2) |
申请公布日期 |
2015.11.10 |
申请号 |
US201113634218 |
申请日期 |
2011.03.17 |
申请人 |
Toyo Tire & Rubber Co., Ltd. |
发明人 |
Doura Masato;Ishizaka Nobuyoshi |
分类号 |
C08G18/28;C08G18/79;C08G18/42;C08G18/48;C08G101/00 |
主分类号 |
C08G18/28 |
代理机构 |
Morrison & Foerster LLP |
代理人 |
Morrison & Foerster LLP |
主权项 |
1. A polishing pad having a polishing layer comprising a thermoset polyurethane foam,
wherein the thermoset polyurethane foam contains, as raw material components, an isocyanate component, and active-hydrogen-containing compounds, and the active-hydrogen-containing compounds comprise one or more polyol compounds, each of which has two or more functional groups, and a monool compound having one functional group, and the monool compound is a compound represented by the following general formula (1):
R1-(OCH2CHR2)n-OH (1) wherein R1 is a methyl or ethyl group, R2 is a hydrogen atom, or a methyl group, and n is an integer of 1 or 2, and the thermoset polyurethane foam has substantially spherical bubbles having an average bubble diameter of 20 to 300 μm. |
地址 |
Osaka-shi JP |