发明名称 SYSTEM AND METHOD FOR CALIBRATING A MEASURING ARRANGEMENT AND CHARACTERIZING A MEASUREMENT MOUNT
摘要 A method and a system for calibrating a measuring arrangement on the basis of a 16-term error model determines a matrix (A) with measured scattering parameters (Sm) from different calibration standards (3) and with associated actual scattering parameters (Sa) of the calibration standards (3) and determines linear-in-T system errors ({tilde over (T)}i) for the calibration of a network analyzer (1) by solving a linear equation system with the determined matrix (A). To solve the linear equation system, a first and a second linear-in-T system error (k,p) are freely selected in each case. With use of reciprocal calibration standards, the determined linear-in-T system errors are weighted with the freely selected first linear-in-T system error ({tilde over (T)}i) or with a correct second linear-in-T system error (pkor(k) dependent upon the first linear-in-T system error (k).
申请公布号 US2015292921(A1) 申请公布日期 2015.10.15
申请号 US201314379741 申请日期 2013.02.20
申请人 ROHDE & SCHWARZ GMBH & CO. KG 发明人 SCHMIDT Lorenz-Peter;SCHRAMM Marcus;HROBAK Michael;SCHUR Jan
分类号 G01D21/00;G01R27/28 主分类号 G01D21/00
代理机构 代理人
主权项
地址 München DE