发明名称 SEMICONDUCTOR STORAGE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor storage device capable of suppressing an area increase.SOLUTION: A semiconductor storage device of an embodiment comprises: first and second memory cell transistors; a first word line WL1 and a second word line WL2; a first transistor 50-1 and a second transistor 50-2; and a first driver circuit 60-1 and a second driver circuit 60-2. The first memory cell transistor is provided above a semiconductor substrate, and includes a charge storage layer. The second memory cell transistor is provided above a first memory cell transistor MT, and includes a charge storage layer. The first driver circuit 60-1 outputs the voltage to be applied to the first word line WL1, and the second driver circuit 60-2 outputs the voltage to be applied to the second word line WL2. The first transistor 50-1 connects the first word line WL1 and the first driver circuit 60-1, and the second transistor 50-2 connects the second word line WL2 and the second driver circuit 60-2. The size of the first transistor 50-1 differs from the size of the second transistor 50-2.
申请公布号 JP2015177002(A) 申请公布日期 2015.10.05
申请号 JP20140052079 申请日期 2014.03.14
申请人 TOSHIBA CORP 发明人 KAMATA HIDEYUKI;MINAMI TOSHIFUMI;HIGASHITSUJI TEPPEI;SATO ATSUYOSHI;YONEHAMA KEISUKE;BABA YASUYUKI;SHINOHARA HIROSHI
分类号 H01L21/8247;G11C16/02;H01L21/336;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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