发明名称 Handler Apparatus and Test Apparatus
摘要 Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.
申请公布号 US2015276862(A1) 申请公布日期 2015.10.01
申请号 US201414472392 申请日期 2014.08.29
申请人 ADVANTEST CORPORATION 发明人 KIKUCHI Aritomo;YAMASHITA Tsuyoshi;AIZAWA Mitsunori;HORINO Hiromitsu;YAMADA Yuya;ONOZAWA Masataka
分类号 G01R31/28;G01R1/04;G01C11/00 主分类号 G01R31/28
代理机构 代理人
主权项 1. A handler apparatus that conveys a device under test to a test socket, comprising: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.
地址 Tokyo JP