发明名称 MASK BLANK, PHASE-SHIFT-MASK PRODUCTION METHOD, PHASE SHIFT MASK, AND SEMICONDUCTOR-DEVICE PRODUCTION METHOD
摘要 This mask blank is provided with a structure obtained by stacking, upon a light-transmitting substrate (10), a phase shift film (11), a light-blocking film (13), and a hard mask film (15), in that order from the light-transmitting substrate side. The phase shift film is formed from a material including silicon. The hard mask film is formed from a material including at least one element selected from silicon and tantalum. The light-blocking film is formed from a material including chrome, and is provided with a structure obtained by stacking three layers, namely a lower layer (13a), an intermediate layer (13b), and an upper layer (13c). The upper layer has the highest chrome content in the light-blocking film. The intermediate layer has the lowest chrome content in the light-blocking film, and includes at least one metal selected from indium, tin, and molybdenum.
申请公布号 WO2015146421(A1) 申请公布日期 2015.10.01
申请号 WO2015JP55125 申请日期 2015.02.24
申请人 HOYA CORPORATION 发明人 SHISHIDO, HIROAKI;NOZAWA, OSAMU;UCHIDA, TAKASHI
分类号 G03F1/32;G03F1/58;G03F1/80 主分类号 G03F1/32
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