发明名称 Fresnel Zone Plate and X-Ray Microscope Using the Fresnel Zone Plate
摘要 [Object] To provide a Fresnel's zone plate having a complex illumination function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel's zone plate. [Solution] A Fresnel's zone plate 1 having a complex illumination function according to the invention has opaque bands 3 and transparent bands 4 arranged alternately in the radial direction from the center concentrically on a flat transparent substrate 2 , and a transmission window 7 formed such that a portion of a plane wave vertically applied onto the upper surface vertically enters directly a sample 6 disposed below the Fresnel's zone plate 1 without dispersion.
申请公布号 US2008094710(A1) 申请公布日期 2008.04.24
申请号 US20070950916 申请日期 2007.12.05
申请人 KYOTO INSTITUTE OF TECHNOLOGY 发明人 ENDOH HISAMITSU
分类号 G02B27/44 主分类号 G02B27/44
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