| 摘要 |
PROBLEM TO BE SOLVED: To provide an ion generating device capable of inspecting output waveform of a secondary coil even in a state a boosting coil or a secondary side circuit is potted. SOLUTION: An inspection terminal 54 which is exposed outside is installed in the casing 5 beforehand, and an output terminal of a secondary coil is connected to this inspection terminal 54. Thereby, even in such a state that the secondary coil is in potting, the output waveform of the secondary coil can be inspected from the inspection terminal 54. COPYRIGHT: (C)2007,JPO&INPIT
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