发明名称 METHOD OF DISPOSING CAPACITIVE ELEMENT
摘要 PROBLEM TO BE SOLVED: To optimally dispose capacitive elements for EMI measures in free spaces on the floor of a semiconductor integrated circuit. SOLUTION: A plurality of free spaces where capacitive elements for EMI measures can be disposed, are extracted from the floor of the semiconductor integrated circuit and individuals are obtained, the individuals being constituted of gene sequences arraying genes which are distinguished by disposing/not disposing capacitive elements regarding the plurality of extracted free spaces. A plurality of individuals with different gene sequences are created, and each of the individuals is evolved by evaluating adaptivity represented by a predetermined index by applying a genetic algorithm. An individual with the highest adaptivity is obtained as an optimal solution, and the capacitive elements are disposed in the free spaces represented by the gene sequences of the individual of the optimal solution. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006268576(A) 申请公布日期 2006.10.05
申请号 JP20050087171 申请日期 2005.03.24
申请人 KAWASAKI MICROELECTRONICS KK 发明人 MIHARA NOBUKAZU
分类号 G06F17/50;H01L21/82;H01L21/822;H01L27/04 主分类号 G06F17/50
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