发明名称 ELECTRONIC CIRCUIT BLOCK TESTING CIRCUIT
摘要 PURPOSE:To obtain an electronic circuit block testing circuit which can be composed of a comparatively small circuit for test and can monitor real operations as well without requiring a lot of test patterns concerning the test of an electronic circuit. CONSTITUTION:When an input address 6 is a prescribed address value an input address identification circuit 2 generates an input switching signal 7 at every block 1 of the electronic circuit, and an input switching circuit 3 is connected so as to selectively input either normal input data 8 or test input data 9 to the block 1. Only when the input switching signal 7 is received, the test input data 9 are inputted to the block 1, and an output address identification circuit 4 receives the input of an output address 10. When the output address 10 is a prescribed address value, an output switching signal 11 is generated and an output switching circuit 5 is connected so as to selectively output either normal output data 12 or test input data 9 only. Only when the output switching signal 11 is received, the normal output data 12 are outputted.
申请公布号 JPH0561713(A) 申请公布日期 1993.03.12
申请号 JP19910223219 申请日期 1991.09.04
申请人 FUJITSU LTD 发明人 HIKOSAKA TAKAHIRO
分类号 G06F11/22 主分类号 G06F11/22
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