发明名称 |
THIN FILM TRANSISTOR SUBSTRATE AND DISPLAY DEVICE |
摘要 |
<p>Provided is a thin film transistor substrate wherein deterioration of dry etching rates of a source electrode and a drain electrode and etching residuals are not generated and a barrier metal between a semiconductor layer and a wiring metal, such as the source electrode and the drain electrode, can be eliminated. A display device is also provided. The thin film transistor substrate is provided with a semiconductor layer (1), a source electrode (2), a drain electrode (3) and a transparent conductive film (4). The source electrode (2) and the drain electrode (3) are composed of an Al alloy thin film, which is formed by patterning wherein dry etching is employed and contains a Si and/or Ge of 0.1-1.5 atm%, a Ni and/or Co of 0.1-3.0 atm% and a La and/or Nd of 0.1-0.5 atm%, and the thin film transistor is directly connected to the semiconductor layer (1).</p> |
申请公布号 |
WO2009091004(A1) |
申请公布日期 |
2009.07.23 |
申请号 |
WO2009JP50482 |
申请日期 |
2009.01.15 |
申请人 |
KABUSHIKI KAISHA KOBE SEIKO SHO;OCHI, MOTOTAKA;KAWAKAMI, NOBUYUKI;TOMIHISA, KATSUFUMI;GOTO, HIROSHI |
发明人 |
OCHI, MOTOTAKA;KAWAKAMI, NOBUYUKI;TOMIHISA, KATSUFUMI;GOTO, HIROSHI |
分类号 |
G02F1/1368;G09F9/30;H01L21/336;H01L29/786;C22C21/00 |
主分类号 |
G02F1/1368 |
代理机构 |
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代理人 |
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地址 |
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