发明名称 PHASE CHANGE MEMORY DEVICE
摘要 A phase change memory device is provided to reduce write time by writing a plurality of cells without increase of write current. A base terminal of a selection switch(SW0) is connected to a word line(WL). A collector terminal of the selection switch is connected to a read / write bit line(RWBL). An emitter terminal of the selection switch is connected to a unit cell(UC), and each unit cell comprises one phase change resistance cell(PCR1) and one switching element(N1). One electrode of the phase change resistance cell is connected to a source terminal of the switching element. The other electrode of the phase change resistance cell is connected to a drain terminal of the switching element. The switching element(N1~N4) corresponds to a plurality of bit lines(BL1~BLn) with one to one.
申请公布号 KR20090037766(A) 申请公布日期 2009.04.16
申请号 KR20070103276 申请日期 2007.10.12
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;HONG, SUK KYOUNG
分类号 G11C13/02;G11C7/18 主分类号 G11C13/02
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