发明名称 |
COATING AND DEVELOPING APPARATUS, COATING AND DEVELOPING METHOD, AND STORAGE MEDIUM |
摘要 |
<P>PROBLEM TO BE SOLVED: To prevent degradation of substrate conveying accuracy by restraining the conveying speed of a conveying mechanism conveying substrates between respective modules each carrying out processing of the substrates. <P>SOLUTION: Resist film forming conveyance means of a plurality of respective resist film formation blocks convey substrates between the modules carrying out various kinds of processing in the blocks independently of one another; a processing block carrying-in conveyance means sequentially and cyclically conveying the substrates to carrying-in exchange stage of each resist film formation block one by one; and an exposure device carrying-in conveyance means carries the substrates carried in a buffer module of each resist film formation block in an exposure device in the order in which the substrates are carried in the carrying-in exchange stage of the resist film formation block. The load of the resist film forming conveyance means is restrained relative to the case where a plurality of or multiple modules of the same type are installed in one resist film formation block in order to achieve equivalent throughput. <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009076893(A) |
申请公布日期 |
2009.04.09 |
申请号 |
JP20080217242 |
申请日期 |
2008.08.26 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
HARA YOSHITAKA;KOZUKI SHINGO;MATSUOKA NOBUAKI |
分类号 |
H01L21/027;H01L21/677 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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