发明名称 COATING AND DEVELOPING APPARATUS, COATING AND DEVELOPING METHOD, AND STORAGE MEDIUM
摘要 <P>PROBLEM TO BE SOLVED: To prevent degradation of substrate conveying accuracy by restraining the conveying speed of a conveying mechanism conveying substrates between respective modules each carrying out processing of the substrates. <P>SOLUTION: Resist film forming conveyance means of a plurality of respective resist film formation blocks convey substrates between the modules carrying out various kinds of processing in the blocks independently of one another; a processing block carrying-in conveyance means sequentially and cyclically conveying the substrates to carrying-in exchange stage of each resist film formation block one by one; and an exposure device carrying-in conveyance means carries the substrates carried in a buffer module of each resist film formation block in an exposure device in the order in which the substrates are carried in the carrying-in exchange stage of the resist film formation block. The load of the resist film forming conveyance means is restrained relative to the case where a plurality of or multiple modules of the same type are installed in one resist film formation block in order to achieve equivalent throughput. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009076893(A) 申请公布日期 2009.04.09
申请号 JP20080217242 申请日期 2008.08.26
申请人 TOKYO ELECTRON LTD 发明人 HARA YOSHITAKA;KOZUKI SHINGO;MATSUOKA NOBUAKI
分类号 H01L21/027;H01L21/677 主分类号 H01L21/027
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