发明名称 Node Extender for In-Circuit Test Systems
摘要 A node extender adaptor to enable existing in-circuit test systems to qualify printed circuit boards with a node count larger than the number of channels available on the in-circuit tester. The node extender adaptor routes signal channels within the in-circuit test platform to a probe from multiple probes in a test fixture. The probes connect to nets on a PCB undergoing qualification tests. The node extender adaptor sits atop test resources. A custom made test fixture attached onto the node extender adaptor. The node extender adaptor comprises multiple channel router line cards. Switches on the channel router line cards facilitate the switching of channels to one of the multiple probes.
申请公布号 US2009091342(A1) 申请公布日期 2009.04.09
申请号 US20070866413 申请日期 2007.10.03
申请人 AGILENT TECHNOLOGIES, INC. 发明人 DYER DENNIS L.;NORRGARD DAYTON;WILLIAMSON EDDIE L.
分类号 G01R1/04;G01R31/28 主分类号 G01R1/04
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