| 摘要 |
A design structure embodied in a machine readable storage medium for designing, manufacturing, and/or testing a design is provided. The design structure provides a duplicate test signal of an output signal under test in an integrated circuit including selecting through a multiplexer an output signal under test, the output signal under test selected from a plurality of output signals of the integrated circuit; providing through the multiplexer a duplicate signal of the selected output signal under test; adding a high impedance load on the duplicate signal thereby reducing the amplitude of the duplicate signal; and amplifying the reduced duplicate signal thereby creating the duplicate test signal.
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