发明名称 REFLECTANCE SPECTRUM MEASUREMENT AT VARIOUS ANGLES
摘要 <p>Measuring reflectance of skin uses an adjustable probe having an illuminator (100) for directing light of more than one wavelength at a given angle onto the skin, a collector (95, 110, 122, 128) for collecting light reflected from the sample at a given angle, and an adjuster (5, 98, 122, 200, Ml, M2), for continuously adjusting the angle of the illuminating light or the collected light. Reflectance is determined according to a predetermined relationship between penetration depth at which the reflections occur, and the wavelength and the angle of adjustment. The angle can be continuously adjusted according to the relationship, or measurements can be selected, so as to maintain a constant penetration depth for a spectrum of wavelengths.</p>
申请公布号 WO2010140085(A1) 申请公布日期 2010.12.09
申请号 WO2010IB52354 申请日期 2010.05.27
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;LIU, YAN;VON BASUM, GOLO;MOESKOPS, BASTIAAN, WILHELMUS, MARIA;UZUNBAJAKAVA, NATALLIA, EDUARDAUNA;THILWIND, RACHEL, ESTELLE 发明人 LIU, YAN;VON BASUM, GOLO;MOESKOPS, BASTIAAN, WILHELMUS, MARIA;UZUNBAJAKAVA, NATALLIA, EDUARDAUNA;THILWIND, RACHEL, ESTELLE
分类号 G01N21/47;A61B5/00 主分类号 G01N21/47
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