发明名称 METHOD FOR FABRICATING MASK AND MASK THEREBY
摘要 PURPOSE: A method for fabricating a mask is provided to ensure a line width coincided with a target line width by controlling or compensating line width variation of mask pattern by a cleaning process. CONSTITUTION: A method for fabricating a mask comprises the steps of: successively depositing a phase shift layer and a light blocking layer on a transparent substrate(110); forming a light blocking layer pattern(131) and a phase shift layer pattern(121) by selectively etching the phase shift layer and the light blocking layer; forming a side wall(150) for protecting the phase shift layer pattern by covering the side; cleansing the substrate; and selectively removing the light blocking layer pattern.
申请公布号 KR20100128826(A) 申请公布日期 2010.12.08
申请号 KR20090047456 申请日期 2009.05.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, JEA YOUNG
分类号 G03F1/00;H01L21/027 主分类号 G03F1/00
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