发明名称 Local metallization and use thereof in semiconductor devices
摘要 An embodiment of the invention provides a method of creating local metallization in a semiconductor structure, and the use of local metallization so created in semiconductor structures. In one respect, the method includes forming an insulating layer on top of a semiconductor substrate; creating a plurality of voids inside the insulating layer, with the plurality of voids spanning across a predefined area and being substantially confined within a range of depth below a top surface of the insulating layer; creating at least one via hole in the insulating layer, with the via hole passing through the predefined area; and filling the via hole, and the plurality of voids inside the insulating layer through at least the via hole, with a conductive material to form a local metallization. A semiconductor structure having the local metallization is also provided.
申请公布号 US7807570(B1) 申请公布日期 2010.10.05
申请号 US20090482763 申请日期 2009.06.11
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 MAXSON JEFFERY B.;SUWARNO-HANDAYANA AURELIA A.;UMMER SHAMAS M.;GIEWONT KENNETH J.;STIFFLER SCOTT RICHARD
分类号 H01L21/44 主分类号 H01L21/44
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