| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a characteristic measuring method capable of measuring a characteristic of a light emitting element with a simple operation while restraining enlargement of a device. <P>SOLUTION: A characteristic measuring method for measuring a characteristic of a semiconductor laser 19 includes a measuring step for measuring an optical output of lights L incident on a light receiving part 9a for each of plural measuring points, at which a first distance between the light receiving part 9a and a light receiving element 9 is changed by opposing the light receiving part 9a of the light receiving element 9 to the semiconductor laser 19; a calculation step for calculating a maximum light receiving angle of the light receiving part 9a at each measuring point based on a ratio of the first distance and a second distance between a position opposed to the semiconductor laser 19 at the light receiving part 9a and a position on an outer periphery of the light receiving part 9a; and a computing step for finding a change rate of the optical output to the maximum light receiving angle after the measuring step and the calculation step. <P>COPYRIGHT: (C)2012,JPO&INPIT |
