发明名称 Termination for superjunction VDMOSFET
摘要 A termination for silicon superjunction VDMOSFET comprises heavily doped N-type silicon substrate which also works as drain region; drain metal is disposed on the back surface of the heavily doped N-type silicon substrate; an N-type silicon epitaxial layer is disposed on the heavily doped N-type silicon substrate; P-type silicon columns and N-type silicon columns are formed in the N-type silicon epitaxial layer, alternately arranged; a continuous silicon oxide layer is disposed on a part of silicon surface in the termination; structures that block the drift of mobile ions (several discontinuous silicon oxide layers arranged at intervals) are disposed on the other part of silicon surface in the termination. The structures that block the drift of mobile ions disposed in the termination region are able to effectively prevent movement of the mobile ions and improve the capability of the power device against the contamination induced by the mobile ions.
申请公布号 US8482064(B2) 申请公布日期 2013.07.09
申请号 US201213493505 申请日期 2012.06.11
申请人 YI YANGBO;LI HAISONG;WANG QIN;TAO PING;ZHANG LIXIN;SUZHOU POWERON IC DESIGN CO., LTD. 发明人 YI YANGBO;LI HAISONG;WANG QIN;TAO PING;ZHANG LIXIN
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
主权项
地址
您可能感兴趣的专利