摘要 |
<p>The present invention relates to an aqueous coating composition for coating a photoresist pattern comprising a polymer containing a lactam group of structure (1) where R1 is independently selected hydrogen, C1-C4 alkyl, C1-C6 alkyl alcohol, hydroxy (OH), amine (NH2), carboxylic acid, and amide (CONH2), represents the attachment to the polymer, m=1-6, and n=1-4. The present invention also relates to a process for manufacturing a microelectronic device comprising providing a substrate with a photoresist pattern, coating the photoresist pattern with the novel coating material reacting a portion of the coating material in contact with the photoresist pattern, and removing a portion of the coating material which is not reacted with a removal solution.</p> |
申请人 |
AZ ELECTRONIC MATERIALS IP (JAPAN) KK |
发明人 |
MUTHIAH THIYAGARAJAN;DAMMEL, RALPH R.;CAO, YI;HONG, SUNGEUN;KANG, WENBING;ANYADIEGWU, CLEMENT |