发明名称 |
SELECTIVE TEST PATTERN PROCESSOR |
摘要 |
A method, system, and computer program product to test a semiconductor device are described. The system includes an input interface to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns. The system also includes a processor to process the subset of the set of test patterns to output test data to the semiconductor device. |
申请公布号 |
US2015113350(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201414502182 |
申请日期 |
2014.09.30 |
申请人 |
International Business Machines Corporation |
发明人 |
Forlenza Donato O.;Forlenza Orazio P.;Grace Michael P.;Robbins Bryan J. |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
1. A system to test a semiconductor device, comprising:
an input interface configured to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns; and a processor configured to process the subset of the set of test patterns to output test data to the semiconductor device. |
地址 |
Armonk NY US |