发明名称 SELECTIVE TEST PATTERN PROCESSOR
摘要 A method, system, and computer program product to test a semiconductor device are described. The system includes an input interface to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns. The system also includes a processor to process the subset of the set of test patterns to output test data to the semiconductor device.
申请公布号 US2015113350(A1) 申请公布日期 2015.04.23
申请号 US201414502182 申请日期 2014.09.30
申请人 International Business Machines Corporation 发明人 Forlenza Donato O.;Forlenza Orazio P.;Grace Michael P.;Robbins Bryan J.
分类号 G01R31/3177 主分类号 G01R31/3177
代理机构 代理人
主权项 1. A system to test a semiconductor device, comprising: an input interface configured to receive a set of test patterns to test the semiconductor device and a user selection corresponding to a subset of the set of test patterns; and a processor configured to process the subset of the set of test patterns to output test data to the semiconductor device.
地址 Armonk NY US
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