| 发明名称 | Systems and methods for frequency domain calibration and characterization | ||
| 摘要 | A system for assigning a characterization and calibrating a parameter is disclosed. The system includes a frequency measurement circuit and a finite state machine. The frequency measurement circuit is configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies. The finite state machine is configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter. | ||
| 申请公布号 | US9148153(B2) | 申请公布日期 | 2015.09.29 |
| 申请号 | US201314143116 | 申请日期 | 2013.12.30 |
| 申请人 | Intel Corporation | 发明人 | Lu Cho-Ying;Li William Yee;Nguyen Khoa Minh;Ravi Ashoke;Yellepeddi Maneesha;Patel Binta M. |
| 分类号 | H03L7/06;H03L1/00;H03L7/099;H03L7/08 | 主分类号 | H03L7/06 |
| 代理机构 | Eschweiler & Associates, LLC | 代理人 | Eschweiler & Associates, LLC |
| 主权项 | 1. A system for assigning a characterization and calibrating a parameter, the system comprising: a frequency measurement circuit configured to measure frequencies of an oscillatory signal and to generate a measurement signal including measured frequencies; and a finite state machine configured to control measurements by the frequency measurement circuit, to assign a characterization to a parameter based on the measurement signal, and to generate a calibration signal based on the characterized parameter. | ||
| 地址 | Santa Clara CA US | ||