发明名称 Method to manufacture silicon quantum islands and single-electron devices
摘要 A method of manufacturing a single-electron transistor device is provided. The method includes forming a thinned region in a silicon substrate, the thinned region offset by a non-selected region. The method also includes forming at least one quantum island from the thinned region by subjecting the thinned region to an annealing process. The non-selected region is aligned with the quantum island and tunnel junctions are formed between the quantum island and the non-selected region. The present invention also includes a single-electron device, and a method of manufacturing an integrated circuit that includes a single-electron device.
申请公布号 US7939398(B2) 申请公布日期 2011.05.10
申请号 US20090619352 申请日期 2009.11.16
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 WASSHUBER CHRISTOPH;BARNA GABRIEL G.;FAYNOT OLIVIER A.
分类号 H01L21/336;H01L21/335;H01L21/44;H01L29/76 主分类号 H01L21/336
代理机构 代理人
主权项
地址