发明名称 Contact probe and probe card
摘要 A contact probe electrically connects the tester side and an electrode pad of a circuit to be tested. This contact probe has a mounting portion on a base end portion mounted on a probe card, a contact portion on a distal end portion brought into contact with the electrode pad, and an arm portion between them elastically supporting the contact portion. The contact portion is provided on a lower end portion of a base portion integrally mounted on a distal end portion of the arm portion. The arm portion has a one-side arm piece supporting the base portion and allowing vertical movement of the base portion and the other-side arm piece supporting the base portion and adjusting an inclination angle of the base portion to reduce a scrub amount of the contact portion. The probe card uses the above-described contact probe.
申请公布号 US9146257(B2) 申请公布日期 2015.09.29
申请号 US201313960960 申请日期 2013.08.07
申请人 Kabushiki Kaisha Nihon Micronics 发明人 Uebayashi Masatomo;Souma Akira
分类号 G01R31/00;G01R1/067 主分类号 G01R31/00
代理机构 Bacon & Thomas, PLLC 代理人 Bacon & Thomas, PLLC
主权项 1. A contact probe to be supported by a probe card substrate on a tester side for extension to an electrode pad of a circuit to be tested for electrically connecting the tester side and the electrode pad of the circuit to be tested, comprising: a mounting portion located on a base end portion and for mounting on the probe card substrate on the tester side, a contact portion located on a distal end portion for contact with the electrode pad of the circuit to be tested, and an arm portion located between them and elastically supporting the contact portion, wherein the contact portion is provided on a lower end portion of a base portion integrally mounted on a distal end portion of the arm portion; and the arm portion is provided with a one-side arm piece supporting the base portion and allowing vertical movement of the base portion and the other-side arm piece supporting the base portion and adjusting an inclination angle of the base portion so as to reduce a scrub amount of the contact portion; and wherein the other-side arm piece is composed of a first distal-end side curved arm piece extending from the distal end portion side, a second base-end side curved arm piece extending from the base end portion side, and a third annular swollen piece connecting the distal-end side curved arm piece and the base-end side curved arm piece to each other.
地址 Tokyo JP