发明名称 CONTROL APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM
摘要 The present invention has a purpose of providing a control apparatus optimizing frequency of putting in monitor wafers. The control apparatus controls a substrate processing apparatus arranging at least a monitor substrate. The control apparatus controls a substrate processing apparatus to optimize the frequency of putting in a monitor substrate based on a difference between the predicted result and the processing result of the monitor substrate processed by the substrate processing apparatus.
申请公布号 KR20150107659(A) 申请公布日期 2015.09.23
申请号 KR20150034439 申请日期 2015.03.12
申请人 TOKYO ELECTRON LIMITED 发明人 TAKENAGA YUICHI;SAITO TAKANORI
分类号 H01L21/677;H01L21/66 主分类号 H01L21/677
代理机构 代理人
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