发明名称 |
CONTROL APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING SYSTEM |
摘要 |
The present invention has a purpose of providing a control apparatus optimizing frequency of putting in monitor wafers. The control apparatus controls a substrate processing apparatus arranging at least a monitor substrate. The control apparatus controls a substrate processing apparatus to optimize the frequency of putting in a monitor substrate based on a difference between the predicted result and the processing result of the monitor substrate processed by the substrate processing apparatus. |
申请公布号 |
KR20150107659(A) |
申请公布日期 |
2015.09.23 |
申请号 |
KR20150034439 |
申请日期 |
2015.03.12 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
TAKENAGA YUICHI;SAITO TAKANORI |
分类号 |
H01L21/677;H01L21/66 |
主分类号 |
H01L21/677 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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