发明名称 RESISTANCE CHANGE MEMORY
摘要 According to one embodiment, a resistance change memory comprises a memory cell array, a write and read circuit, a temperature sensor, and a memory controller. The memory cell array comprises memory cells including magnetic tunnel junction (MTJ) elements. The write and read circuit performs a write operation and a read operation for the memory cells. The temperature sensor outputs temperature information corresponding to a temperature of the memory cell array. The memory controller controls the write operation and the read operation by the write and read circuit in accordance with the temperature information.
申请公布号 US2015262639(A1) 申请公布日期 2015.09.17
申请号 US201414482904 申请日期 2014.09.10
申请人 FUJITA Katsuyuki 发明人 FUJITA Katsuyuki
分类号 G11C11/16;G11C29/44 主分类号 G11C11/16
代理机构 代理人
主权项 1. A resistance change memory comprising: a memory cell array comprising memory cells including magnetic tunnel junction (MTJ) elements; a write and read circuit which performs a write operation and a read operation for the memory cells; a temperature sensor which outputs temperature information corresponding to a temperature of the memory cell array; and a memory controller which controls the write operation and the read operation by the write and read circuit in accordance with the temperature information.
地址 Seoul KR