发明名称 Memories and methods of forming thin-film transistors using hydrogen plasma doping
摘要 Methods of forming thin-film transistors and memories are disclosed. In one such method, polycrystalline silicon is hydrogen plasma doped to form doped polycrystalline silicon. The doped polycrystalline silicon is then annealed. The hydrogen plasma doping and the annealing are decoupled.
申请公布号 US9136282(B2) 申请公布日期 2015.09.15
申请号 US201514599886 申请日期 2015.01.19
申请人 Micron Technology, Inc. 发明人 Qin Shu;Liu Haitao;Lu Zhenyu
分类号 H01L21/00;H01L21/84;H01L27/12;H01L27/115;H01L29/04;H01L29/16;H01L21/02;H01L21/223;H01L21/324;H01L21/285 主分类号 H01L21/00
代理机构 Schwegman Lundberg & Woessner, P.A. 代理人 Schwegman Lundberg & Woessner, P.A.
主权项 1. A method of forming a memory cell string, comprising: forming polycrystalline silicon in an opening in a stack of alternating layers of poly-silicon material and dielectric material to form a pillar of a channel for a NAND string; hydrogen plasma doping the polycrystalline silicon to form doped polycrystalline silicon; in-situ depositing of a deposition material; separately annealing the doped polycrystalline silicon, wherein the hydrogen plasma doping and the annealing are decoupled; and removing the deposition material after annealing the doped polycrystalline silicon.
地址 Boise ID US