| 摘要 |
A method for monitoring surface phenomena comprises: - measuring a first surface plasmon resonance angle value (ϕSPR,REF) of a sample region (REG1), - measuring a first critical angle value (ϕTIR,REF) of the sample region (REG1), - causing a change of surface concentration (cM1,SRF) of an analyte (M1) at the sample region (REG1), - changing the bulk composition at the sample region (REG1), - measuring a second surface plasmon resonance angle value (ϕSPR(t)) of the sample region (REG1), - measuring a second critical angle value (ϕTIR(t)) of the sample region (REG1), and - determining an indicator value (ϕAUX(t)) indicative of the change of the surface concentration (cM1,SRF), wherein the indicator value (ϕAUX(t)) is determined from the second surface plasmon resonance angle value (ϕSPR(t)) by compensating an effect of the bulk composition, and wherein the magnitude (ϕCOMP) of said effect is determined by using the second critical angle value (ϕTIR(t)). |
