发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
In accordance with an embodiment, a semiconductor memory device includes a substrate and memory transistors on the substrate. The substrate has a semiconductor layer having impurity diffusion regions which become sources or drains. The memory transistors share the impurity diffusion regions.;Each of the memory transistors has a first insulating film on the substrate, a charge storage layer on the first insulating film, a second insulating film on the charge storage layer, and a control gate on the second insulating film. A bottom surface of the control gate is parallel to a top surface of the charge storage layer. |
申请公布号 |
US2015255470(A1) |
申请公布日期 |
2015.09.10 |
申请号 |
US201414327718 |
申请日期 |
2014.07.10 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Okamoto Tatsuya |
分类号 |
H01L27/115;H01L21/3213;H01L21/764 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device comprising:
a substrate comprising a semiconductor layer comprising impurity diffusion regions which become sources or drains; and memory transistors, on the substrate, which share the impurity diffusion regions, wherein each of the memory transistors comprises a first insulating film on the substrate, a charge storage layer on the first insulating film, a second insulating film on the charge storage layer, and a control gate on the second insulating film, and a bottom surface of the control gate is parallel to a top surface of the charge storage layer. |
地址 |
Minato-ku JP |