发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
摘要 In accordance with an embodiment, a semiconductor memory device includes a substrate and memory transistors on the substrate. The substrate has a semiconductor layer having impurity diffusion regions which become sources or drains. The memory transistors share the impurity diffusion regions.;Each of the memory transistors has a first insulating film on the substrate, a charge storage layer on the first insulating film, a second insulating film on the charge storage layer, and a control gate on the second insulating film. A bottom surface of the control gate is parallel to a top surface of the charge storage layer.
申请公布号 US2015255470(A1) 申请公布日期 2015.09.10
申请号 US201414327718 申请日期 2014.07.10
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Okamoto Tatsuya
分类号 H01L27/115;H01L21/3213;H01L21/764 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor memory device comprising: a substrate comprising a semiconductor layer comprising impurity diffusion regions which become sources or drains; and memory transistors, on the substrate, which share the impurity diffusion regions, wherein each of the memory transistors comprises a first insulating film on the substrate, a charge storage layer on the first insulating film, a second insulating film on the charge storage layer, and a control gate on the second insulating film, and a bottom surface of the control gate is parallel to a top surface of the charge storage layer.
地址 Minato-ku JP