发明名称 |
Processing system for detecting in-situ arcing events during substrate processing |
摘要 |
A processing system for detecting in-situ arcing events during substrate processing is provided. The processing systems includes at least a plasma processing chamber having a probe arrangement, wherein the probe arrangement is disposed on a surface of the processing chamber and is configured to measure at least one plasma processing parameter. The probe arrangement includes a plasma-facing sensor and a measuring capacitor, wherein the plasma-facing sensor is coupled to a first plate of the measuring capacitor. The probe arrangement also includes a detection arrangement that is coupled to a second plate of the measuring capacitor, wherein the detection arrangement is configured for converting an induced current flowing through the measuring capacitor into a set of digital signals, which is processed to detect the in-situ arcing events. |
申请公布号 |
US9129779(B2) |
申请公布日期 |
2015.09.08 |
申请号 |
US201213441187 |
申请日期 |
2012.04.06 |
申请人 |
Lam Research Corporation |
发明人 |
Booth Jean-Paul;Keil Douglas |
分类号 |
G01R27/26;H01H9/50;B23K9/00;H01J37/32;G01R31/34;G01D5/24;H02H1/00;G01R31/12;H02H3/44 |
主分类号 |
G01R27/26 |
代理机构 |
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代理人 |
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主权项 |
1. A processing system for detecting in-situ arcing events during substrate processing, comprising:
at least a plasma processing chamber having a probe arrangement, wherein said probe arrangement is disposed on a surface of said processing chamber and is configured to measure at least one plasma processing parameter, wherein said probe arrangement includes
a plasma-facing sensor, anda measuring capacitor, wherein said plasma-facing sensor is coupled to a first plate of said measuring capacitor; and a detection arrangement, said detection arrangement is coupled to a second plate of said measuring capacitor, wherein said detection arrangement is configured for converting an induced current flowing through said measuring capacitor into a set of digital signals, said set of digital signals being processed to detect said in-situ arcing events. |
地址 |
Fremont CA US |