发明名称 ATOMIC LAYER DEPOSITION OF ANTIMONY OXIDE FILMS
摘要 Antimony oxide thin films are deposited by atomic layer deposition using an antimony reactant and an oxygen source. Antimony reactants may include antimony halides, such as SbCl3, antimony alkylamines, and antimony alkoxides, such as Sb(OEt)3. The oxygen source may be, for example, ozone. In some embodiments the antimony oxide thin films are deposited in a batch reactor. The antimony oxide thin films may serve, for example, as etch stop layers or sacrificial layers.
申请公布号 US2015249005(A1) 申请公布日期 2015.09.03
申请号 US201514658000 申请日期 2015.03.13
申请人 ASM INTERNATIONAL, N.V. 发明人 MATERO RAIJA H.;LINDROOS LINDA;SPREY HESSEL;MAES JAN WILLEM;DE ROEST DAVID;PIERREUX DIETER;VAN DER JEUGD KEES;D'URZO LUCIA;BLOMBERG TOM E.
分类号 H01L21/02;H01L21/22 主分类号 H01L21/02
代理机构 代理人
主权项 1. (canceled)
地址 ALMERE NL