| 摘要 |
PROBLEM TO BE SOLVED: To suppress the increase of the number of voltage comparators with an increase in a chip temperature detection range.SOLUTION: A temperature sensor of a semiconductor device includes: a temperature detection circuit 46 for outputting voltage according to a chip temperature; a reference voltage forming circuit 50 for forming a plurality of reference voltages; and a plurality of voltage comparators 53 to 56 for comparing the output voltage of the temperature detection circuit with each reference voltage to form a chip temperature detection signal of a plurality of bits. In addition, the temperature sensor includes a control circuit 45 capable of shifting a chip temperature detection range by controlling the reference voltage on the basis of the chip temperature detection signal to change correspondence between the chip temperature detection signal and the chip temperature. The increase of the chip temperature detection range, which necessitates changing of only the correspondence between the chip temperature detection signal and the chip temperature, is not accompanied by the increase of the number of voltage comparators. |
