发明名称 SAMPLE HOLDING SYSTEM
摘要 A sample holding system comprises a sample holder adapted to operate in an operational temperature range of below 1K to at least 380K. The system may also comprise a substrate support. The sample holder has a substrate in the form of a circuit board. One or more sample holder connectors are utilised for providing electrical connection to the sample holder. The sample holder has a dedicated region for receiving a sample to be studied. Electrical circuitry provides electrical connection between the said sample holder electrical connectors and a part of the sample holder, through the circuit board.
申请公布号 WO2015128679(A1) 申请公布日期 2015.09.03
申请号 WO2015GB50596 申请日期 2015.03.02
申请人 OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED 发明人 JEDAMZIK, DIETER;SHARP, PETER
分类号 G01R1/04;G01N1/42;G01R31/28 主分类号 G01R1/04
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