发明名称 THRESHOLD VOLTAGE COMPENSATION IN A MEMORY
摘要 Threshold voltages in a charge storage memory are controlled by threshold voltage placement, such as to provide more reliable operation and to reduce the influence of factors such as neighboring charge storage elements and parasitic coupling. Pre-compensation or post-compensation of threshold voltage for neighboring programmed “aggressor” memory cells reduces the threshold voltage uncertainty in a flash memory system. Using a buffer having a data structure such as a lookup table provides for programmable threshold voltage distributions that enables the distribution of data states in a multi-level cell flash memory to be tailored, such as to provide more reliable operation.
申请公布号 US2015243351(A1) 申请公布日期 2015.08.27
申请号 US201514707684 申请日期 2015.05.08
申请人 Micron Technology, Inc. 发明人 Moschiano Violante;Vali Tommaso;Naso Giovanni;Sarin Vishal;Radke William Henry;Pekny Theodore T.
分类号 G11C11/56 主分类号 G11C11/56
代理机构 代理人
主权项 1. A method of operating a memory, comprising: providing an analog ramp signal to a control gate of a memory cell; converting a value of a digital signal corresponding to the analog ramp signal to a converted digital value; and providing the converted digital value to a buffer coupled to the memory cell, wherein a difference between the converted digital value and the digital signal value results in a difference in threshold voltage in the memory cell.
地址 Boise ID US