发明名称 |
CMOS Image Sensors Including Vertical Transistor and Methods of Fabricating the Same |
摘要 |
Provided is a complementary metal-oxide-semiconductor (CMOS) image sensor. The CMOS image sensor can include a substrate having a first device isolation layer defining and dividing a first active region and a second active region, a photodiode disposed in the substrate and can be configured to vertically overlap the first device isolation layer, a transfer gate electrode can be disposed in the first active region and can be configured to vertically overlap the photodiode, and a floating diffusion region can be in the first active region. The transfer gate electrode can be buried in the substrate. |
申请公布号 |
US2015243693(A1) |
申请公布日期 |
2015.08.27 |
申请号 |
US201414340719 |
申请日期 |
2014.07.25 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Oh Young-Sun;Lee Kyung-Ho;Ahn Jung-Chak;Jeong Hee-Geun |
分类号 |
H01L27/146;H01L29/778 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A complementary metal-oxide-semiconductor (CMOS) image sensor comprising:
a substrate having a first device isolation layer defining and dividing a first active region and a second active region; a photodiode disposed in the substrate and configured to vertically overlap the first device isolation layer; a transfer gate electrode disposed in the first active region and configured to vertically overlap the photodiode, wherein the transfer gate electrode extends into the substrate; and a floating diffusion region disposed in the first active region. |
地址 |
Suwon-si KR |