发明名称 CMOS Image Sensors Including Vertical Transistor and Methods of Fabricating the Same
摘要 Provided is a complementary metal-oxide-semiconductor (CMOS) image sensor. The CMOS image sensor can include a substrate having a first device isolation layer defining and dividing a first active region and a second active region, a photodiode disposed in the substrate and can be configured to vertically overlap the first device isolation layer, a transfer gate electrode can be disposed in the first active region and can be configured to vertically overlap the photodiode, and a floating diffusion region can be in the first active region. The transfer gate electrode can be buried in the substrate.
申请公布号 US2015243693(A1) 申请公布日期 2015.08.27
申请号 US201414340719 申请日期 2014.07.25
申请人 Samsung Electronics Co., Ltd. 发明人 Oh Young-Sun;Lee Kyung-Ho;Ahn Jung-Chak;Jeong Hee-Geun
分类号 H01L27/146;H01L29/778 主分类号 H01L27/146
代理机构 代理人
主权项 1. A complementary metal-oxide-semiconductor (CMOS) image sensor comprising: a substrate having a first device isolation layer defining and dividing a first active region and a second active region; a photodiode disposed in the substrate and configured to vertically overlap the first device isolation layer; a transfer gate electrode disposed in the first active region and configured to vertically overlap the photodiode, wherein the transfer gate electrode extends into the substrate; and a floating diffusion region disposed in the first active region.
地址 Suwon-si KR