发明名称 USE OF CsOH IN DIELECTRIC CMP SLURRY
摘要 PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing composition including an abrasive and cesium hydroxide, and a method for polishing a dielectric layer associated with an integrated circuit using cesium hydroxide containing a polishing composition.SOLUTION: A composition for chemical mechanical polishing composition comprises fumed abrasive grains and about 0.01 to about 5.0 wt.% of at least one Cs+ basic salt. Preferably, the composition for chemical mechanical polishing comprises water, about 1 to about 50 wt.% of fumed silica, and about 0.1 to 2.0 wt.% of CsOH.
申请公布号 JP2015147938(A) 申请公布日期 2015.08.20
申请号 JP20150094245 申请日期 2015.05.01
申请人 CABOT MICROELECTRONICS CORP 发明人 ALICIA F WALTERS;BRIAN L MUELLER;JAMES A DIRKSEN;PAUL M FEENEY
分类号 B24B57/02;C09K3/14;B24B37/00;B24B37/11;C09G1/02;H01L21/304;H01L21/306;H01L21/3105 主分类号 B24B57/02
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