发明名称 |
Cu-Ga Alloy Sputtering Target, and Method for Producing Same |
摘要 |
A melted and cast Cu—Ga alloy sputtering target containing 22 at % or more and 29 at % or less of Ga, and remainder being Cu and unavoidable impurities, wherein the Cu—Ga alloy sputtering target has an eutectoid structure configured from a mixed phase of a ζ phase, which is an intermetallic compound layer of Cu and Ga, and a γ phase, and satisfies a relational expression of D≦7×C−150 when a diameter of the γ phase is D μm and a Ga concentration is C at %. A sputtering target having a cast structure is advantageous in that gas components such as oxygen can be reduced in comparison to a sintered compact target. Thus, it is possible to reduce oxygen and obtain a target with a favorable cast structure, in which the segregated phase is dispersed, by continuously solidifying the sputtering target having the foregoing cast structure under a solidifying condition of a constant cooling rate. |
申请公布号 |
US2015232980(A1) |
申请公布日期 |
2015.08.20 |
申请号 |
US201314421036 |
申请日期 |
2013.10.28 |
申请人 |
JX Nippon Mining & Metals Corporation |
发明人 |
Tamura Tomoya |
分类号 |
C23C14/34;H01J37/34;C22C28/00;B22D11/124;B22D11/041;B22D11/045;C23C14/14;B22D11/126 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
1. A melted and cast Cu—Ga alloy sputtering target containing 22 at % or more and 29 at % or less of Ga, and remainder being Cu and unavoidable impurities, wherein the Cu—Ga alloy sputtering target has an eutectoid structure,. excluding a structure containing a lamellar structure, configured from a mixed phase of a ζ phase, which is an intermetallic compound layer of Cu and Ga, and a γ phase, and satisfies a relational expression of D≦7×C−150 when a diameter of the γ phase is D μm and a Ga concentration is C at %. |
地址 |
Tokyo JP |