发明名称 METHODS AND APPARATUSES FOR CALCULATING THE ELECTRIC FIELD STRENGTH ON THE REFLECTION WAVE IN THE IRREGULAR SURFACE MODEL
摘要 <p>Provided are a method and an apparatus for calculating electric field strength of a reflected wave. The method for calculating electric field strength of a reflected wave is configured to receive an irregular surface model such as diffusion pattern information for a medium having irregular characteristics or the like, generate a ray path on the surface of the irregular surface model, and calculate the electric field strength of the reflected wave by using a weighted value of the electric field strength, previously generated by measuring a pattern of the reflected wave, which is reflected from the surface of the irregular surface model. Therefore, the present invention is capable of shortening the time required for calculating the electric field strength by reflecting the irregular characteristics of the surface of an object and using the weighted value of the electric field strength, which has been previously measured.</p>
申请公布号 KR20150091795(A) 申请公布日期 2015.08.12
申请号 KR20140012443 申请日期 2014.02.04
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 YOON, YOUNG KEUN
分类号 G06F19/00;G06F17/50 主分类号 G06F19/00
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