Method for the collision-free positioning of a micromanipulator tool

摘要

A method for the collision-free positioning of a micromanipulation tool relative to a sample carrier with the aid of a microscope, comprising the following steps: a) determining the focal position Zp of at least one point P on the surface of the sample carrier by focusing a microscope objective with a first numerical aperture NA1 on the at least one point; b) positioning the micromanipulation tool on the optical axis of the microscope; c) determining the focal position ZM of the micromanipulation tool by focusing the microscope objective or a second microscope objective with a second numerical aperture NA2 smaller than the first numerical aperture NA1 onto the tip of the micromanipulation tool; d) calculating the lowering distance ZA(P) taking into account a predetermined tolerance profile ΔZ by the following equation:;ZA(P)=ZM−Zp−ΔZ where ΔZ=ΔZM+ΔZp, wherein ΔZM and/or ΔZp is a predetermined tolerance in the determination of the position of the manipulation tool and sample carrier, respectively; and e) positioning the micromanipulation tool at the point P by lowering by the lowering distance ZA(P).

主权项

1. A method for the collision-free positioning of a micromanipulation tool relative to a sample carrier with the aid of a microscope, comprising the following steps:
a) determining the focal position Zp of at least one point P on the surface of the sample carrier by focusing a microscope objective with a first numerical aperture NA1 on the at least one point; b) positioning the micromanipulation tool on the optical axis of the microscope; c) determining the focal position ZM of the micromanipulation tool by focusing the microscope objective or a second microscope objective with a second numerical aperture NA2 smaller than the first numerical aperture NA1 onto the tip of the micromanipulation tool; d) calculating a lowering distance ZA(P) taking into account a predetermined tolerance profile ΔZ by the following equation:
ZA(P)=ZM−ZP−ΔZ where
ΔZ=ΔZM+ΔZP wherein ΔZM and ΔZp is a predetermined tolerance in the determination of the position of the manipulation tool and the sample carrier, respectively;
e) positioning the micromanipulation tool at the point P by lowering by the lowering distance ZA (P).