发明名称 Three-dimensional semiconductor memory devices and method of fabricating the same
摘要 Provided are three-dimensional semiconductor memory devices and methods of fabricating the same. The device may include an electrode structure extending in a first direction and including electrodes and insulating patterns which are alternately and repeatedly stacked on a substrate, and vertical active patterns penetrating the electrode structure. At least an uppermost electrode of the electrodes is divided into a plurality of physically isolated segments arranged in the first direction. The segments of the uppermost electrode are electrically connected to each other.
申请公布号 US9099347(B2) 申请公布日期 2015.08.04
申请号 US201213415388 申请日期 2012.03.08
申请人 Samsung Electronics Co., Ltd. 发明人 Yun Jang-Gn;Seol Kwang Soo;Park Youngwoo
分类号 H01L29/76;H01L27/115 主分类号 H01L29/76
代理机构 Myers Bigel Sibley & Sajovec, P.A. 代理人 Myers Bigel Sibley & Sajovec, P.A.
主权项 1. A three-dimensional semiconductor memory device, comprising: an electrode structure extending in a first direction and including electrodes and insulating patterns which are alternately and repeatedly stacked on a substrate, at least an uppermost electrode of the electrodes being divided into a plurality of physically isolated segments arranged in the first direction; vertical active patterns that penetrate the electrode structure; and an electrode-dielectric layer disposed between each of the vertical, active patterns and each of the electrodes, wherein the segments of the uppermost electrode are electrically connected to each other.
地址 KR