发明名称 |
Three-dimensional semiconductor memory devices and method of fabricating the same |
摘要 |
Provided are three-dimensional semiconductor memory devices and methods of fabricating the same. The device may include an electrode structure extending in a first direction and including electrodes and insulating patterns which are alternately and repeatedly stacked on a substrate, and vertical active patterns penetrating the electrode structure. At least an uppermost electrode of the electrodes is divided into a plurality of physically isolated segments arranged in the first direction. The segments of the uppermost electrode are electrically connected to each other. |
申请公布号 |
US9099347(B2) |
申请公布日期 |
2015.08.04 |
申请号 |
US201213415388 |
申请日期 |
2012.03.08 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Yun Jang-Gn;Seol Kwang Soo;Park Youngwoo |
分类号 |
H01L29/76;H01L27/115 |
主分类号 |
H01L29/76 |
代理机构 |
Myers Bigel Sibley & Sajovec, P.A. |
代理人 |
Myers Bigel Sibley & Sajovec, P.A. |
主权项 |
1. A three-dimensional semiconductor memory device, comprising:
an electrode structure extending in a first direction and including electrodes and insulating patterns which are alternately and repeatedly stacked on a substrate, at least an uppermost electrode of the electrodes being divided into a plurality of physically isolated segments arranged in the first direction; vertical active patterns that penetrate the electrode structure; and an electrode-dielectric layer disposed between each of the vertical, active patterns and each of the electrodes, wherein the segments of the uppermost electrode are electrically connected to each other. |
地址 |
KR |