发明名称 Multiple Silicide Integration Structure and Method
摘要 A structure and method for providing a multiple silicide integration is provided. An embodiment comprises forming a first transistor and a second transistor on a substrate. The first transistor is masked and a first silicide region is formed on the second transistor. The second transistor is then masked and a second silicide region is formed on the first transistor, thereby allowing for device specific silicide regions to be formed on the separate devices.
申请公布号 US2015206871(A1) 申请公布日期 2015.07.23
申请号 US201514673388 申请日期 2015.03.30
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Yeh Der-Chyang;Hsia Hsing-Kuo;Lin Hao-Hsun;Chao Chih-Ping;Su Chin-Hao;Cheng Hsi-Kuei
分类号 H01L27/06;H01L29/45 主分类号 H01L27/06
代理机构 代理人
主权项 1. A semiconductor device comprising: a substrate with a first transistor and a second transistor, the second transistor being a different type of transistor than the first transistor; a first silicide region located on the first transistor, the first silicide region comprising a first material and having a first thickness; and a second silicide region located on an emitter and a first portion of a top surface of a base connection of the second transistor but not on a second portion of the top surface of the base connection, the second silicide region comprising a second material different from the first material and having a second thickness different from the first thickness.
地址 Hsin-Chu TW