发明名称 VERIFICATION METHOD AND VERIFICATION APPARATUS
摘要 A verification apparatus detects a first delay circuit connected to an output side of a second isolator in a first netlist including first and second isolators, in which the first isolator is inserted into a first path between first and second power domains under first rule, and the second isolator is inserted into a second path between the first and third power domains under second rule. To verify whether the first and second isolators are inserted under the first and second rules respectively, the verification apparatus searches a second netlist generated by performing an optimization step including delay adjustment on the first netlist for a connection destination of the first power domain, and if the connection destination is not the first delay circuit, continues searching, and detects the second power domain, to thereby specify the first path at the time of the first rule being applied.
申请公布号 US2015205908(A1) 申请公布日期 2015.07.23
申请号 US201514592597 申请日期 2015.01.08
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 IWAKI Yoshitoshi
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A verification method comprising: detecting, by a processor, a first delay circuit connected to an output side of an isolator in a first netlist including the isolator which is inserted into a path between a first power domain and a second power domain in accordance with a rule and which fixes a signal value outputted from the first power domain; searching, by the processor, a second netlist generated by performing an optimization step including a delay adjustment on the first netlist for a connection destination of the first power domain at the time of verifying whether or not the isolator is inserted in accordance with the rule; and specifying, by the processor, the path at the time of the rule being applied by continuing, at the time of the connection destination being a second delay circuit other than the first delay circuit, the searching and detecting the second power domain without recognizing the second delay circuit as the connection destination.
地址 Yokohama-shi JP