发明名称 TRANSISTOR AND METHOD FOR FABRICATING THE SAME
摘要 A method for fabricating a transistor including the following steps is provided. First, a gate electrode is formed on a substrate, and a gate insulating layer is formed on the substrate in sequence, wherein the gate insulating layer covers the substrate and the gate electrode. Next, a patterned channel layer and a hard-mask layer are formed on the gate insulating layer, wherein the patterned channel layer and the hard-mask layer are located above the gate electrode, and the hard-mask layer is disposed on the patterned channel layer. Afterwards, a source and a drain are formed on the gate insulating layer by a wet etchant. The part of the hard-mask layer that is not covered by the source and the drain is removed by the wet etchant until the patterned channel layer is exposed, so as to form a plurality of patterned hard-mask layers.
申请公布号 US2015200281(A1) 申请公布日期 2015.07.16
申请号 US201414262802 申请日期 2014.04.27
申请人 Au Optronics Corporation 发明人 Yang Chao-Shun
分类号 H01L29/66;H01L29/786;H01L21/465 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method for fabricating a transistor, comprising: forming a gate electrode on a substrate; forming a gate insulating layer on the gate electrode and the substrate to cover the substrate and the gate electrode; forming a patterned channel layer and a hard-mask layer on the gate insulating layer, wherein the patterned channel layer and the hard-mask layer are disposed above the gate electrode, and the hard-mask layer is located on the patterned channel layer; and forming a source and a drain on the gate insulating layer by a wet etchant and removing part of the hard-mask layer that is not covered by the source and the drain by the wet etchant until the patterned channel layer is exposed, so as to form a plurality of patterned hard-mask layers.
地址 Hsinchu TW